{
  "schemaVersion": 1,
  "publisher": "Eucalyptus One LLC",
  "product": "traceflow",
  "tool": "trace-resistance",
  "title": "PCB trace resistance",
  "scope": "Free website calculator example; not a report from the pre-release application.",
  "calculatorUrl": "https://eucalyptusone.com/tools/pcb/trace-resistance/",
  "inputs": {
    "length": "100",
    "width": "1",
    "thickness": "35",
    "current": "1",
    "temperature": "20"
  },
  "inputLabels": {
    "length": "Trace length (mm)",
    "width": "Trace width (mm)",
    "thickness": "Copper thickness (µm)",
    "current": "Current (A)",
    "temperature": "Copper temperature (°C)"
  },
  "result": {
    "summary": "DC resistance: 49.25714285714285 mΩ\nVoltage drop: 49.25714285714285 mV\nPower loss: 49.25714285714285 mW\nCurrent density: 28.57142857142857 A/mm²",
    "metrics": [
      {
        "label": "DC resistance",
        "value": 49.25714285714285,
        "unit": "mΩ"
      },
      {
        "label": "Voltage drop",
        "value": 49.25714285714285,
        "unit": "mV"
      },
      {
        "label": "Power loss",
        "value": 49.25714285714285,
        "unit": "mW"
      },
      {
        "label": "Current density",
        "value": 28.57142857142857,
        "unit": "A/mm²"
      }
    ],
    "steps": [
      {
        "title": "Copper cross-sectional area",
        "body": "Total effective area = 0.035 mm².\nCopper resistivity = 1.724 × 10^(-8) × [1 + 0.00393 × (T − 20)] Ω·m."
      },
      {
        "title": "DC loss calculation",
        "body": "R = ρL / A = 0.049257142857142854 Ω.\nV = IR = 0.049257142857142854 V. P = I^2*R = 0.049257142857142854 W."
      }
    ],
    "warnings": []
  },
  "assumptions": "Uniform copper with ρ₂₀ = 1.724 × 10⁻⁸ Ω·m and α = 0.00393/°C. The model accepts −100 to 300 °C; check whether the linear approximation is suitable at your temperature. Excludes self-heating, skin effect, pads, neck-downs, and manufacturing variation. Not an ampacity rating.",
  "provenance": "Extracted from PCBA Workbench v1.2.0; independent SI-unit reference tests."
}